Atomic Swiss Knife accurately measures materials for quantum computers

Devices—from smartphones to multicookers—that perform multiple functions are often more convenient and

potentially cheaper than genericthe tools they replace, and their multiple functions often work better than they would individually. The new three-in-one device is a sort of Swiss Army knife for atomic-scale measurements. NIST researcher Joseph Strossio and his colleagues, including Johannes Schwenk and Sungmin Kim, present a detailed recipe for creating the device.

We describe our plan to createdevice for other people to copy it. They can modify the tools they have; they no longer need to buy new equipment.

Joseph Strassio, NIST researcher

Simultaneously taking measurements on a scale fromnanometers to millimeters, researchers thanks to the device can focus on the atomic origin of some unusual properties of materials. They can be invaluable for next-generation computers and communication devices.

Properties that scientists are interested in includethe flow of electric current without resistance, as well as quantum surges of electrical resistance, which can serve as new electrical switches. In addition, researchers are interested in new methods for designing quantum bits - they can lead to the creation of solid-state quantum computers.

For quantum materials that usually consistof one or more atomically thin layers, strong quantum effects between groups of electrons are stored at large distances. These effects lead to those properties that can be used for new technologies.

To more accurately study the properties of quantummaterials, scientists combined in one instrument three precision measuring instruments. Two devices — an atomic force microscope (AFM) and a scanning tunneling microscope (STM) —examine the microscopic properties of solids. At the same time, the third instrument registers the macroscopic properties of magnetic transfer — the current flow in the presence of a magnetic field.

To create the device, scientists developed AFM andmagnetic measuring device, which would be more compact and have fewer moving parts than in previous versions. They then integrated the tools with the existing STM.

Up: a photograph of a sample inside a scanning probe module showing eight electrical contacts with a plate containing a sample for examination. The tip of the probe and its reflection in the sample are visible in the center. Bottom: Image of the atomic strength of an aluminum sample, showing the arrangement of atoms. The red curve indicates that the aluminum film is superconducting in the presence of an electric current with zero voltage. Provided by: NIS

Both STM and AFM use a pointed tip to probe the atomic structure of surfaces.

The ensemble is installed inside a cryostat, a device,which cools the system to one hundredth of a degree above absolute zero. At this temperature, the random quantum jitter of atomic particles is minimized, and large-scale quantum effects become more pronounced and easier to measure. The three-in-one device, which is protected from external electrical noise, is also 5–10 times more sensitive than any previous set of similar devices.

Although three completely independent devices - STM, AFMand installation of magnetic transport - perform the same measurements, their movements can disrupt the sampling and reduce the accuracy of the analysis. Individual instruments can also make it difficult to copy exact conditions. For example, such as temperature and angle of rotation between each ultra-thin layer of a quantum material at which previous measurements were made.

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